Journal of Canadian Petroleum Technology
Volume 51, Number 4, July 2012, pp. 236-243

SPE-161015-PA

Atomic-Force Microscopy: A New Tool for Gas-Shale Characterization

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DOI  More information 10.2118/161015-PA http://dx.doi.org/10.2118/161015-PA

Citation

  • Javadpour, F., Moravvej Farshi, M., and Amrein, M. 2012. Atomic-Force Microscopy: A New Tool for Gas-Shale Characterization. J Can Pet Technol  51 (4): 236-243. SPE-161015-PA. http://dx.doi.org/10.2118/161015-PA.

Summary

An atomic-force microscope (AFM), a relatively new tool for studying surface characterization, can generate image features down to atomic resolution. Not only can the AFM obtain topographic images of surfaces, but it also can simultaneously identify different materials on a surface at high resolution. Since its invention in the 1980s, AFM has been used in material science and medical research, although it has not received the attention that it probably deserves in reservoir engineering. The emergence of unconventional shale-gas reservoirs, however, has opened new research frontiers for the AFM in the field of reservoir engineering. The unique capabilities of the AFM make it ideal for studying nanopores, organic materials (kerogen), minerals, and diagenetic fractures in shales. It also can be used to measure localized bulk modulus of elasticity on a surface for further implications in geophysical exploration and designing hydraulic fracturing. We introduce different AFM techniques for all these applications, along with example results.

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History

  • Original manuscript received: 11 May 2011
  • Revised manuscript received: 17 November 2011
  • Manuscript approved: 16 March 2012
  • Published online: 7 June 2012
  • Version of record: 1 July 2012